• Film Crystalline Analysis Material Structure Xrd Machine X Ray Diffractometer
  • Film Crystalline Analysis Material Structure Xrd Machine X Ray Diffractometer
  • Film Crystalline Analysis Material Structure Xrd Machine X Ray Diffractometer
  • Film Crystalline Analysis Material Structure Xrd Machine X Ray Diffractometer
  • Film Crystalline Analysis Material Structure Xrd Machine X Ray Diffractometer
  • Film Crystalline Analysis Material Structure Xrd Machine X Ray Diffractometer

Film Crystalline Analysis Material Structure Xrd Machine X Ray Diffractometer

After-sales Service: Yes
Warranty: 1 Year
Detect Material: Powder
Automatic: Semi-Automatic
Application: Powder or Film
Diameter: 1
Customization:
Gold Member Since 2021

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Basic Info.

Principle
X Ray Diffraction
Length
100 to 800mm
Weight
Less Than 20kg
Transport Package
Wooden Case
Specification
customized
Trademark
dd
Origin
Dandong
HS Code
9099210000

Product Description



DX-27miniX-ray Diffractometer
Drafter of China X-ray diffractometer industry standard


 
Film Crystalline Analysis Material Structure Xrd Machine X Ray Diffractometer
Overview
DX-27mini benchtop X-ray diffractometer is
a multipurpose powder diffraction analytical
instrument that specifically designed and
developed for industrial production and quality
control. DX-27mini offers a lot - in a highly
compact design, especially suitable for catalyst,
titanium dioxide, cement, pharmaceutical and
other product manufacturing industries.

Application
 
Phase identification in unknown samples
 
Quantitative analysis of known phases in
mixed samples
Rievtveld analysis
  
 
Power Solid state X-ray generator: 600W(40kV, 15mA).
Reliability: <0.005%
X-ray tube Cermet X-ray tube, Cu target, power: 2.4kW, focus: 1 x 10mm
Water cooling (water flowrate>2L/min)
Goniometer Sample horizontal θs-θd structure
Diffraction circle radius 150mm
Measurement range -3 ~150°
Scan mode Stepping, Omg
Minimum step width angle 0.0001°
Angle repeatability 0.0005°
Linearity of diffraction angle <0.02° (Standard sample, within the full spectrum)
Detector Closed proportional detector Semiconductor array detector
Maximum linear count rate 5×105CPS 9×107CPS
Energy resolution =25% =1keV
Scatter dose =1μSv/h (Outside the X-ray protective device)
Comprehensive stability =0.5%
Dimensions 640×480×770 (W×D×H) mm
 
 
 
 
 
 
 
 
 
 
 

Features


•     High-frequency high-voltage X-ray generator does not only improve the stability of the instrument, but also ensure the repeatability of the measured data.
•    The goniometer θs and θd arms are driven by servo motor + optical coding control technology. The diffrac- tion angle linearity is less than 0.02° in the diffraction angle measurement range.
•    Scattered ray protection is safer and more reliable; the radiation protection door is automatically prohibi- ted from opening when the sample is measured. In any case, operators can be protected from scattered  radiation.
•    Configure the most advanced metal ceramic X ray tube, to ensure long service life.
•    Compact size can be mounted on the bench without the need for a specific laboratory environment. Simp- le to use, operate and maintain.

XRD Control Software and THCMXPD


Can run under 64-bit Windows 10, automatically control the X-ray diffractometer; collect diffraction data to formASC
code data file to save; data file processing includes: auto-     matic peak finding, manual peak finding, integrated inten-   sity, peak Height, center of gravity, background subtraction, smoothing, peak shape enlargement, multiple drawing,
half-height calculation, spectrum printing.



THCMXPD diffraction data processing software is a full-fea-    tured XRD data processing software, which can complete the following analysis:
•     Qualitative phase analysis: quick check, classification search,phase finding, solid solution analysis.
•     Quantitative phase analysis: Full spectrum fitting quan-  titative analysis that does not involve crystal structure is an innovative method, and at the same time, the grain   size of different crystal directions can be obtained


Applications
DX-27mini can be flexibly adapted to qualitative and quantitative analysis of polycrystalline materials. In qua- litative analysis, instrumental measurements are compared to known phase databases to identify unknown
structures. In the quantitative analysis, the characteristics of the solid mixture are used to determine the relati-
ve content of the crystalline compound or the uncrystallized phase.


Film Crystalline Analysis Material Structure Xrd Machine X Ray Diffractometer
Film Crystalline Analysis Material Structure Xrd Machine X Ray Diffractometer


Film Crystalline Analysis Material Structure Xrd Machine X Ray Diffractometer
Film Crystalline Analysis Material Structure Xrd Machine X Ray Diffractometer
Film Crystalline Analysis Material Structure Xrd Machine X Ray Diffractometer














 

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